Work

Enabling Efficient Deep Learning on MCU With Transient Redundancy Elimination

Year: 2024

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/tc.2024.3449102

Authors: Jiesong Liu, Feng Zhang, Jiawei Guan, Hsin-Hsuan Sung, Xiaoguang Guo, Saiqin Long, Xiaoyong Du, Xipeng Shen

Institutions: North Carolina State University, Renmin University of China, Jinan University

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401808691

FWCI: 0.28

Cites: 41

Cited by: 2

Related to: 10