Work

Research on twist detection of electroplated diamond wire saw based on machine vision

Year: 2024

Type: conference-paper

Source: International Conference on Image Processing and Intelligent Control (IPIC)

DOI: 10.1117/12.3038631

Authors: Chenxi Zhou, PeiQi Ge, WenBo Bi, YuKang Zhao, JinTao Zheng

Institution: Shandong University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401814498

FWCI: 0.723

Cites:

Cited by: 1

Related to: 10