Express packaging defects detection model based on YOLOv8
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3038509
Authors: ZiYe Zhang, XiangQuan Chang
Institution: University of Jinan
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401818400
