Work

Determining the Permittivity of a PCB Dielectric Using Striplines Considering Copper Roughness

Year: 2024

Type: article

Source: IEEE Microwave and Wireless Technology Letters

DOI: 10.1109/lmwt.2024.3443768

Authors: Juan P. Sánchez-Muñoz, Svetlana C. Sejas-García, Chudy Nwachukwu, Reydezel Torres-Torres

Institutions: National Institute of Astrophysics, Optics and Electronics, Advanced Micro Devices (United States)

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401835996

FWCI: 0.308

Cites: 30

Cited by: 3

Related to: 10