Work

A High Accuracy and Low-Cost Fatigue Life Evaluation Method for IGBTs Based on Variable-Parameter Power Cycling

Year: 2024

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2024.3449855

Authors: Yongle Huang, Xin Tang, Yifei Luo, Fei Xiao, Binli Liu, Xin Li

Institution: Naval University of Engineering

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G4531488992

OpenAlex ID: W4401879006

FWCI: 0.103

Cites: 30

Cited by: 1

Related to: 10