Junction temperature monitoring of silicon carbide MOSFET based on turn‐off voltage spike
Year: 2024
Type: article
DOI: 10.1002/cta.4245
Authors: Xinbo Liu, Bo Liu, Shuiyuan He, Lijian Diao, Lijian Diao, Lijun Diao, Lijun Diao
Institutions: Beijing Jiaotong University, Zhejiang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401890363