Work

Data-Aware 3-D TLC NAND flash Memory Reliability Optimization

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3441568

Author: Sami Salamin

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402040577

FWCI: 0.343

Cites: 28

Cited by: 2

Related to: 10