Work

Failure Mechanism Analysis of Single-Event Effect in 4H-SiC Inverters

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3441555

Authors: Yong Gu, Yurui Yang, Jie Ma, Hongyang Wen, Xiangyu Hou, Jingjing Hong, Lanlan Yang, Jiaxing Wei, Ao Liu, Runhua Huang, Song Bai, Long Zhang, Siyang Liu, Weifeng Sun

Institution: Southeast University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

Funders: Natural Science Foundation of Jiangsu Province, Postdoctoral Science Foundation of Jiangsu Province, National Key Research and Development Program of China

Awards: G476316154, G5307193416, G5740526740, G7865108876

OpenAlex ID: W4402040604

FWCI: 0.416

Cites: 26

Cited by: 4

Related to: 10