Work

An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3453329

Authors: Linxin Yin, Yingzhao Li, Xiaoyi Zhang, Xiongfei Zhai, Guojun Han

Institution: Guangdong University of Technology

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Basic and Applied Basic Research Foundation of Guangdong Province

Awards: G1779829727, G599531952, G6109617406

OpenAlex ID: W4402124223

FWCI: 1.373

Cites: 31

Cited by: 8

Related to: 10