Work

Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects

Year: 2024

Type: article

Source: IEEE Transactions on Electromagnetic Compatibility

DOI: 10.1109/temc.2024.3448361

Authors: Kyunghoon Lee, Sangyeong Jeong, Wooshin Choi, Jung-Hwan Choi, Jingook Kim

Institutions: Ulsan National Institute of Science and Technology, Samsung Electronics (South Korea)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Research Foundation of Korea, Samsung

Awards: G4166784896, G8576944826

OpenAlex ID: W4402125343

FWCI: 0.104

Cites: 29

Cited by: 1

Related to: 10