Work

Effects of Grain Size on Various Electrical Trap Extraction Methods in Low-Temperature Polysilicon Thin Films

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3449248

Authors: Joohee Oh, Woohui Lee, Myoung Geun Cha, Hyoungsub Kim

Institutions: Sungkyunkwan University, Samsung (South Korea), Samsung Display (South Korea)

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Samsung Display

OpenAlex ID: W4402126591

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Cites: 21

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Related to: 10