Work

Low-Frequency Noise Characteristics of Recessed Channel Ferroelectric Field-Effect Transistors

Year: 2024

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2024.3452776

Authors: Been Kwak, Jangsaeng Kim, Kitae Lee, Wonjun Shin, Daewoong Kwon

Institutions: Hanyang University, Seoul National University, Sungkyunkwan University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

OpenAlex ID: W4402129090

FWCI: 1.439

Cites: 24

Cited by: 14

Related to: 10