Work

Analysis Method of Dynamic Read Variation in a TFT-Type Synaptic Devices With Poly-Si Channel Structure

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3440957

Authors: Min-Kyu Park, Joon Hwang, Ho-Nam Yoo, Jong-Ho Bae, Jae-Joon Kim, Jong-Ho Lee

Institutions: Seoul National University, Kookmin University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402159450

FWCI: 0.104

Cites: 26

Cited by: 1

Related to: 10