Improved Depthwise Separable Convolution for Transfer Learning in Fault Diagnosis
Year: 2024
Type: article
Source: IEEE Sensors Journal
Authors: Hai Xu, Yongchang Xiao, Kun Sun, Lingli Cui
Institutions: Weifang University, Beijing University of Technology
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4402186944