Work

Multi-Domain Dynamics and Ultimate Scalability of CMOS-Compatible FeFETs

Year: 2024

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2024.3454638

Authors: Nilesh Pandey, Yogesh Singh Chauhan, Leonard F. Register, Sanjay K. Banerjee

Institutions: The University of Texas at Austin, Indian Institute of Technology Kanpur

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4402263140

FWCI: 0.617

Cites: 34

Cited by: 6

Related to: 10