Work

Extremely Rare Anomaly Detection Pipeline in Semiconductor Bonding Process With Digital Twin-Driven Data Augmentation Method

Year: 2024

Type: article

Source: IEEE Transactions on Components Packaging and Manufacturing Technology

DOI: 10.1109/tcpmt.2024.3454991

Authors: Mingu Jeon, In-Ho Choi, Seung-Woo Seo, Seong-Woo Kim

Institutions: Seoul National University, Samsung Electronics (South Korea)

Language: English

Topic: Anomaly Detection Techniques and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Institute of Information and Communications Technology, Institute of Engineering Research, Seoul National University

Award: G5728106873

OpenAlex ID: W4402263201

FWCI: 1.033

Cites: 51

Cited by: 7

Related to: 10