Research of Single-Event Burnout in P-NiO/n-Ga 2 O 3 Heterojunction Diode
Year: 2024
Type: article
Authors: Cheng-Hao Yu, Hui Yang, Wen-Sheng Zhao, Da-Wei Wang, Hao-Min Guo, Yue Hu, Xiao-Dong Wu, Xin Tan
Institution: Hangzhou Dianzi University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2590409249, G4465573294, G6904421978
OpenAlex ID: W4402350755