Simulating diffusion and repulsion of charges in single photon semiconductor detectors
Year: 2024
Type: conference-paper
Source: Imaging and Applied Optics
Authors: Manuel Ballester, Jaromir Kaspar, Francesc Massanés, Alexander Hans Vija, Aggelos K. Katsaggelos
Institutions: Northwestern University, Siemens Healthcare (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4402355250