Work

Femtogram-Sensitive Cantilever Platform for Dynamic Graphene Oxide Nanosheet Monitoring

Year: 2024

Type: article

Abstract: This study introduces a new approach to optimizing graphene oxide (GO) properties using liquid-phase plasma treatment in a microenvironment. Our innovation exploits atomic force microscopy (AFM) cantilever frequency tracking to monitor mass variations in GO, which are indicative of surface oxidation-reduction processes or substituent doping (boron/nitrogen). Complementary in situ Raman spectroscopy has observed D/G band shifts, and X-ray photoelectron spectroscopy (XPS) determined the C/O ratio and B/N doping levels pre- and post-treatment, confirming chemical tuning to GO. We can achieve femtogram-level precision in detecting nanomaterial mass changes by correlating elemental ratios with AFM cantilever frequency measurements. This multifaceted approach not only enhances our understanding of the chemical properties of GO but also establishes a new, versatile method for monitoring, modifying, and optimizing the properties of nanomaterials.

Source: Analytical Chemistry

DOI: 10.1021/acs.analchem.4c01714

Authors: Pei-Ying Lin, Sheng-Han Cheng, Yu-Chieh Hsu, David E. Beck, Shuchen Hsieh

Institutions: National Sun Yat-sen University, Oxford Instruments (United States), Kaohsiung Medical University, National Kaohsiung University of Science and Technology

Language: English

Topic: Graphene research and applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $4,500

Funders: National Sun Yat-sen University, Kaohsiung Medical University, National Science and Technology Council