Work

Study of the Multifrequency Susceptibility of Operational Amplifiers

Year: 2024

Type: conference-paper

Abstract: This paper deals with the susceptibility of operational amplifiers (op-amps) in multifrequency injection. After an in-depth analysis of the different failure mechanisms that induces DC-offset based on experimental results on a general-purpose op-amp, the paper proposes a risk assessment method based on continuous wave susceptibility test results.

Source: International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)

DOI: 10.1109/emceurope59828.2024.10722498

Authors: A. Boyer, F. Caignet

Institutions: Centre National de la Recherche Scientifique, Université Toulouse III - Paul Sabatier, Laboratoire d'Analyse et d'Architecture des Systèmes, Institut National des Sciences Appliquées de Toulouse

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4402387982

FWCI: 0.806

Cites: 10

Cited by: 1

Related to: 10