Work

Reliability Analysis of GaAs-PIN Limiter Under Ultra-Wideband Pulse Radiation

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3456832

Authors: Xuelin Yuan, Shengxian Chen, Yonglong Li, Ming Hu, Teng Zhou

Institution: Sun Yat-sen University

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Institute of Electrical and Electronics Engineers

OpenAlex ID: W4402401322

FWCI: 0.208

Cites: 27

Cited by: 2

Related to: 10