Work

Bound-Constrained Expectation Maximization for Weibull Competing-Risks Device Reliability

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3457728

Authors: Uttara Chakraborty, Duane S. Boning, Carl V. Thompson

Institution: Massachusetts Institute of Technology

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

OpenAlex ID: W4402401367

FWCI: 1.058

Cites: 54

Cited by: 4

Related to: 10