Work

Ultra-Low Dark Count Rate SPAD Fully Integrated in a 180 nm High-Voltage CMOS Process

Year: 2024

Type: article

Source: IEEE Photonics Technology Letters

DOI: 10.1109/lpt.2024.3457009

Authors: Borna Požar, Ivan Berdalović, Tihomir Knežević, Tomislav Suligoj

Institutions: University of Zagreb, Faculty of Electrical Engineering and Computing in Zagreb, Ruđer Bošković Institute

Language: English

Topic: Advanced Optical Sensing Technologies

Subfield: Instrumentation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: European Science Foundation

Awards: G3306578842, G4180109945

OpenAlex ID: W4402401588

FWCI: 2.024

Cites: 19

Cited by: 9

Related to: 10