FlexSensor: Automated measurement software for rapid photonic circuits capturing
Year: 2024
Type: software-paper
Abstract: This paper introduces the automation measurement software FlexSensor for capturing resonant spectra, an innovative and extensible software program developed explicitly for measuring and evaluating Silicon Photonic (SiPh) circuits. Wafer-level Wafer-level Silicon Photonics allows the integration of numerous optical components and structures on a single wafer. However, researchers and engineers need precise and repeatable measurements to characterize them and face significant challenges when dealing with large numbers of complex systems on a single wafer. A toolchain gap hampers the measuring of such highly integrated photonic structures: While the setup necessitates the integration of an optimized hardware and software toolchain, there is neither software nor a standardized way to implement a reproducible measurement routine for a massive set of measurements. FlexSensor allows integration and control of external hardware (tunable lasers, analog-digital converters) and supports measurement data storage and evaluation. The software enables researchers and engineers to efficiently analyze the spectral response of photonic structures and facilitate rapid measuring.
Source: SoftwareX
Authors: Christoph Schmidt, Jakob Wilhelm Hinum-Wagner, Reinhard Klambauer, Alexander Bergmann
Institutions: Graz University of Technology, AMS (Austria)
Language: English
Topic: Photonic and Optical Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $970
OpenAlex ID: W4402417130