Work

3D visual detection method for position and pose discrimination of stacked IC devices

Year: 2024

Type: conference-abstract

Source: Seventh International Symposium on Precision Mechanical Measurements

DOI: 10.1117/12.3032394

Authors: 耀华邓, 声宇林

Institution: Guangdong University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402504199

Cites:

Cited by:

Related to: 10