Interface modeling analysis using density functional theory in highly reliable Pt/HfO2/TaOx/Ta self-rectifying memristor
Year: 2024
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0227603
Authors: Sheng-Guang Ren, Ge-Qi Mao, Yi-Bai Xue, Yu Zhang, Jia-Yi Sun, Wen-Bin Zuo, Yi Li, Kan-Hao Xue, Xiang-Shui Miao
Institution: Huazhong University of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1120454491, G1573139930
OpenAlex ID: W4402609046