Work

The Error Analysis of Bit Weight Self-Calibration Methods for High-Resolution SAR ADCs

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3458071

Authors: Yanhang Chen, Siji Huang, Qifeng Huang, Yifei Fan, Jie Yuan

Institution: Hong Kong University of Science and Technology

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Innovation and Technology Fund

Award: High-speed (2.4GS/s) High-resolution (14bit) Single-channel Pipeline ADC Chip Design For High-end Electronics

OpenAlex ID: W4402623251

FWCI: 0.523

Cites: 26

Cited by: 5

Related to: 10