Work

A Novel Space Charge Optical Measurement Method in Electronic Device Insulation System

Year: 2024

Type: article

Source: IEEE Transactions on Industrial Electronics

DOI: 10.1109/tie.2024.3454455

Authors: Tianrun Qi, Hanwen Ren, Haoyu Gao, Qingmin Li

Institution: North China Electric Power University

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, China Postdoctoral Science Foundation, Natural Science Foundation of Beijing Municipality

Awards: G2691219192, G5219071022, G5866289460, G6762876190, G8825610558

OpenAlex ID: W4402628515

FWCI: 0.192

Cites: 30

Cited by: 2

Related to: 10