Work

Impact of Ionizing Radiation on the Behavior of Pseudo-Resistors with Temperature-Dependent Analysis

Year: 2024

Type: conference-paper

Source: Symposium on Microelectronics Technology and Devices

DOI: 10.1109/sbmicro64348.2024.10673870

Authors: Antonio Aurélio de Sousa Gomes, Cleiton Felix Pereira, Marcilei A. Guazzelli, Alexis C. Vilas Boas, Ricardo Germano Stolf, Renato Camargo Giacomini

Institution: Centro Universitário FEI

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402628894

FWCI:

Cites: 9

Cited by:

Related to: 10