Work

Impact of Ionizing Radiation and Temperature on the Performance of pMOSFETs with Different Layouts

Year: 2024

Type: conference-paper

Source: Symposium on Microelectronics Technology and Devices

DOI: 10.1109/sbmicro64348.2024.10673855

Authors: Guilherme Inácio Grandesi, Paulo R. Garcia, Alexis V. Boas, Renato Giacomini, L. E. Seixas, Marcilei A. Guazzelli

Institutions: Centro Universitário FEI, Centro de Tecnologia da Informação Renato Archer

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402629348

FWCI: 0.781

Cites: 10

Cited by: 1

Related to: 10