Work

Combined effect of total ionizing dose and electromagnetic pulse on MOSFET devices

Year: 2024

Type: article

Source: Journal of Instrumentation

DOI: 10.1088/1748-0221/19/09/p09025

Authors: W.B. Wu, H.J. Zhou, H.T. Zhang, Y. Liu, Q. Liu, F.K. Xu, Z.G. Zhao

Institutions: Institute of Applied Physics and Computational Mathematics, CAEP Software Center for High Performance Numerical Simulation

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402640352

FWCI:

Cites: 17

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Related to: 10