Work

Study on the Effects of Burst Pulse Magnetic Field Interference in IGBT Switching Circuit for High Power Application

Year: 2024

Type: article

Source: IEEE Transactions on Electromagnetic Compatibility

DOI: 10.1109/temc.2024.3454081

Authors: Zheng-Wei Du, Zhe Chen, Dongyan Zhao, Yuankui Wang, Rui Wu, Hui Li, Jin Meng, Wei-Heng Shao, Xin Zhang, Wen-Yan Yin

Institutions: Zhejiang University, China Electronic Product Reliability and Environmental Test Institute, Naval University of Engineering

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402661255

FWCI: 0.718

Cites: 27

Cited by: 7

Related to: 10