Work

Influence of silicon interlayers on the structural and reflective X-ray characteristics of Ni/Ti multilayer mirrors

Year: 2024

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s1600576724007702

Authors: Ruslan Smertin, Evgeny Antyushin, Ilya Malyshev, Masha Zorina, Nikolai Chkhalo, Pavel Yunin, Sergey Garakhin, Vladimir Polkovnikov, Yuliy Vainer

Institution: Institute for Physics of Microstructures

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Russian Science Foundation

Awards: G3087602767, G5170722908

OpenAlex ID: W4402670624

FWCI: 1.442

Cites: 32

Cited by: 5

Related to: 10