Work

Development of a cuttings migration simulation device based on electrical resistance tomography technology

Year: 2024

Type: conference-abstract

Source: International Conference on Advanced Algorithms and Signal Image Processing (AASIP)

DOI: 10.1117/12.3045781

Authors: Shiyan Xing, Daqian Yang, Shuaibin Zhang

Institution: Xi'an Shiyou University

Language: English

Topic: Geophysical and Geoelectrical Methods

Subfield: Geophysics

Field: Earth and Planetary Sciences

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4402672643

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