A Sub-Sampling Front-End with 12 fF Load for On-Chip Measurements
Year: 2024
Type: conference-paper
Source: Conference proceedings
Authors: Aashish T. R., Shouri Chatterjee
Institution: Samsung Semiconductor (United States)
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4402703043