Work

Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742026

Authors: T. Billaux, J. Raoult, P. Hoffmann

Institutions: Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Gramat

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402712638

FWCI: 1.612

Cites: 7

Cited by: 2

Related to: 10