Work

High Sensitivity Temperature Measurements to Track and Compensate Aging Effects on CMOS Amplifiers

Year: 2024

Type: article

Abstract: This article presents a method to monitor and compensate gain degradation produced by aging in linear CMOS amplifiers. The proposed procedure relies on a stand-alone temperature sensor circuit. DC measurements at the output of the temperature sensor allow to monitor high-frequency gain, and to select an adaptive biasing to keep a constant gain along the circuit lifetime. The approach is validated experimentally on a high-frequency Power Amplifier, which was subjected to an accelerated aging degradation. Experimental results demonstrate the capability to keep the amplifier gain within 0.3 dB from its fresh value, even after important device aging degradation.

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3465236

Authors: Diego Mateo, Xavier Aragones, Enrique Barajas, Sergio Martínez Domingo, Xavier Gisbert, Josep Altet

Institution: Universitat Politècnica de Catalunya

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $2,495

Funder: Agencia Estatal de Investigación