Work

Calibration and Measurement of V ce - T j Correlation With Temperature Distribution of IGBT and Interconnections

Year: 2024

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2024.3463694

Authors: Guanyu Lu, Ke Ma, Yuli Feng

Institution: Shanghai Jiao Tong University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

OpenAlex ID: W4402742586

FWCI: 0.82

Cites: 23

Cited by: 8

Related to: 10