Work

Research on single event effect of silicon carbide diode induced by Californium source

Year: 2024

Type: conference-abstract

Source: International Conference on Optoelectronic Information and Computer Engineering (OICE)

DOI: 10.1117/12.3039508

Authors: hong zhang, Chao Peng, Teng Ma, zhangang Zhang, Yuebo Liu, Yujuan He, Bin Li, Zhifeng Lei

Institutions: China Electronic Product Reliability and Environmental Test Institute, South China University of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402764306

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