A Sparse Bayesian Learning for Diagnosis of Nonstationary and Spatially Correlated Faults With Application to Multistation Assembly Systems
Year: 2024
Type: article
Abstract: Sensor technology developments provide a basis for effective fault diagnosis in manufacturing systems. However, the limited number of sensors due to physical constraints or undue costs hinders the accurate diagnosis in the actual process. In addition, time-varying operational conditions that generate nonstationary process faults and the correlation information in the process require to consider for accurate fault diagnosis in the manufacturing systems. This article proposes a novel fault diagnosis method: clustering spatially correlated sparse Bayesian learning (CSSBL), and explicitly demonstrates its applicability in a multistation assembly system that is vulnerable to the above challenges. Specifically, the method is based on a practical assumption that it will likely have a few process faults (sparse). In addition, the hierarchical structure of CSSBL has several parameterized prior distributions to address the above challenges. As posterior distributions of process faults do not have closed form, this paper derives approximate posterior distributions through Variational Bayes inference. The proposed method’s efficacy is provided through numerical and real-world case studies utilizing an actual autobody assembly system. The generalizability of the proposed method allows the technique to be applied in fault diagnosis in other domains, including communication and healthcare systems. Note to Practitioners—This article proposes a new process fault diagnosis method: clustering spatially correlated sparse Bayesian learning. This method effectively diagnoses time-varying defects by leveraging the correlation structures in the process when sensor measurements are insufficient. The actual autobody assembly process is utilized to show the proposed method’s effectiveness. The proposed method performs superior to the benchmark methods in fault detection capability. In addition, the proposed method accurately estimates the severity of the process faults, providing significant information to the practitioners for their decision-making in the maintenance schedule. Specifically, the error between the estimation from the proposed method and the actual severity of the process faults achieves less than 10% of error of all the benchmark methods when there exists a high correlation between the variations of the fixture locators in the autobody assembly system.
Authors: Jihoon Chung, Zhenyu Kong
Institutions: Pusan National University, Virginia Tech
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
Award: G8762635460
OpenAlex ID: W4402767109