Wavelet Knowledge-Driven Transformer for Intelligent Machinery Fault Detection With Zero-Fault Samples
Year: 2024
Type: article
Source: IEEE Sensors Journal
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4173286937, G512382985, G582674296
OpenAlex ID: W4402770788
