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Defect Detection on Metal Laptop Cases by Up-sampling and Down-sampling Method

Year: 2024

Type: conference-paper

Source: International Conference on Innovations in Intelligent Systems and Applications (INISTA)

DOI: 10.1109/inista62901.2024.10683851

Authors: Hsien-I Lin, Satrio Dwi Sanjaya, Landge Rupa

Institutions: National Yang Ming Chiao Tung University, National Taipei University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402811724

FWCI: 0.721

Cites: 8

Cited by: 1

Related to: 10