Work

Investigation of TID effects on electrical characteristics of GaN MIS-HEMT with LPCVD-grown SiN passivation

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Semiconductor Electronics

DOI: 10.1109/icse62991.2024.10681365

Authors: Chih-Yi Yang, Chin-Han Chung, You-Chen Weng, Jui-Sheng Wu, Tsung-Ying Yang, Edward-Yi Chang

Institution: National Yang Ming Chiao Tung University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402835977

FWCI: 1.562

Cites: 11

Cited by: 2

Related to: 10