Work

Reliability Analysis of Multibridge Channel Field Effect Transistor

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Semiconductor Electronics

DOI: 10.1109/icse62991.2024.10681374

Authors: Huang Ganlin, N. Ezaila Alias, M. L. Peng Tan, M. N. Hamzah, Yasmin Abdul Wahab, Hanim Hussin

Institutions: University of Technology Malaysia, University of Malaya, Universiti Teknologi MARA System, Universiti Teknologi MARA

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Universiti Teknologi Malaysia

OpenAlex ID: W4402836012

FWCI:

Cites: 10

Cited by:

Related to: 10