Work

Effects of Thickness and Anisotropic Strain on Polarization Switching Properties of Sub-10nm Epitaxial Hf0.5Zr0.5O2 Thin Films

Year: 2024

Type: article

Source: Chinese Physics Letters

DOI: 10.1088/0256-307x/41/11/117701

Authors: Kuan 宽 Liu 刘, Kai 楷 Liu 刘, Xingchang 醒昌 Zhang 张, Jie 杰 Fang 方, Feng 锋 Jin 金, Wenbin 文彬 Wu 吴, Chao 超 Ma 马, Lingfei 凌飞 Wang 王

Institutions: University of Science and Technology of China, Hunan University, Collaborative Innovation Center of Advanced Microstructures, Nanjing University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402875824

FWCI: 0.513

Cites: 57

Cited by: 5

Related to: 10