Work

Digital Twin Enabled Open-Circuit Fault Diagnosis for Five-Level ANPC Multilevel Converters

Year: 2024

Type: article

Source: IEEE Journal of Emerging and Selected Topics in Power Electronics

DOI: 10.1109/jestpe.2024.3468332

Authors: Majid T. Fard, Benjamin J. Luckett, JiangBiao He

Institutions: University of Kentucky, University of Tennessee at Knoxville

Language: English

Topic: Multilevel Inverters and Converters

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

Funder: National Science Foundation

Award: Collaborative Research: Digital Twin Predictive Reliability Modeling of Solid-State Transformers

OpenAlex ID: W4402894997

FWCI: 1.232

Cites: 20

Cited by: 12

Related to: 10