Degradation Mechanism and Stability of Flexible Self-Aligned Top-Gate InGaZnO TFT
Year: 2024
Type: article
Authors: Cong Peng, Meng Xu, Longlong Chen, Xifeng Li, Jianhua Zhang
Institution: Shanghai University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4004667468, G6478819551, G7946861727
OpenAlex ID: W4402895799