Work

Analysis of a novel 3C-SiC thin layer on silicon diaphragms for enhanced stress amplification in MEMS piezoresistive pressure sensors

Year: 2024
Type: article
Abstract: application of a 3C-SiC layer on a Si diaphragm to achieve higher stress amplification Analysis of a novel 3C-SiC thin layer on silicon diaphragms for enhanced stress amplification in MEMS piezoresistive pressure sensors
Language: English
Open Access status: diamond
OpenAlex ID: W4402902237
FWCI: 0.104
Cites:
Cited by: 1
Related to: 10