Work

Measuring thermal resistance of high-power LED junction case based on integral difference method

Year: 2024

Type: conference-paper

Source: International Conference on Information Science, Electrical and Automation Engineering (ISEAE)

DOI: 10.1117/12.3037591

Authors: Zhefang Yang, Pengxiang Li, Yunfei Jia, Xiao Chang, Shangkun Wang

Institutions: State Grid Corporation of China (China), Taiyuan University of Technology

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402915174

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