Work

Sensitivity Analysis of Ge Source Double Gate TFET Under Heavy Ion Irradiation

Year: 2024

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2024.3463870

Authors: Shreyas Tiwari, Rajesh Saha, Girdhar Gopal, Tarun Varma

Institutions: Malaviya National Institute of Technology Jaipur, National Institute Of Technology Silchar, National Institute of Technology Patna

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402915194

FWCI: 1.333

Cites: 33

Cited by: 13

Related to: 10